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A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage.

A. Yan, L. Ding, Z. Zhou, Z. Huang, J. Cui, P. Girard, and X. Wen. ATS, page 1-6. IEEE, (2022)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications.A. Yan, Z. Fan, L. Ding, J. Cui, Z. Huang, Q. Wang, H. Zheng, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications.A. Yan, J. Xiang, Y. Chang, Z. Huang, J. Cui, P. Girard, and X. Wen. Microelectron. J., (September 2023)Design of Low-Cost Approximate CMOS Full Adders.A. Yan, S. Wei, Z. Li, J. Cui, Z. Huang, P. Girard, and X. Wen. ISCAS, page 1-5. IEEE, (2023)SASL-JTAG: A Light-Weight Dependable JTAG.S. Wang, S. Wei, J. Ma, H. Kai, Y. Higami, H. Takahashi, A. Shimizu, X. Wen, and T. Ni. DFT, page 1-3. IEEE, (2023)A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.A. Yan, Y. Chen, J. Zhou, J. Cui, T. Ni, X. Wen, and P. Girard. ATS, page 1-5. IEEE, (2020)A High-Performance and P-Type FeFET-Based Non-Volatile Latch.A. Yan, Y. Chen, Z. Huang, J. Cui, and X. Wen. ATS, page 1-5. IEEE, (2023)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.S. Shi, S. Holst, and X. Wen. MCSoC, page 501-507. IEEE, (2023)Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.T. Ni, J. Bian, Z. Yang, M. Nie, L. Yao, Z. Huang, A. Yan, and X. Wen. IEEE Des. Test, 39 (5): 34-42 (2022)Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing.M. Wu, J. Huang, X. Wen, and K. Miyase. ITC, page 1-10. IEEE Computer Society, (2008)Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard.L. Wang, R. Apte, S. Wu, B. Sheu, K. Lee, X. Wen, W. Jone, C. Yeh, W. Wang, H. Chao and 6 other author(s). ITC, page 1-9. IEEE Computer Society, (2008)

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Disambiguation of "Wen, Xiaoqing"

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A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Xiaoqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage.