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Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability.

, , , , , , , , , , , , , , , и . IRPS, стр. 1-10. IEEE, (2019)

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Stephan Meneghini

Thomas Meneghini

Matteo Garavoglia

Matteo Gabba

Matteo Bertini

 

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