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High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.

, , , , , , , и . IEICE Trans. Inf. Syst., 93-D (1): 2-9 (2010)

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Kohei Tatsumi

Kohei Tatsumi

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Susanne Koheil

 

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