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Post-BIST Fault Diagnosis for Multiple Faults.

, , , , , , и . IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)

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Koji Kameo

Satoko Yamazaki

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Post-BIST Fault Diagnosis for Multiple Faults., , , , , , и . IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)New Class of Tests for Open Faults with Considering Adjacent Lines., , , , , , и . Asian Test Symposium, стр. 301-306. IEEE Computer Society, (2009)Evaluation of transition untestable faults using a multi-cycle capture test generation method., , , и . DDECS, стр. 273-276. IEEE Computer Society, (2010)Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset., , , и . Asian Test Symposium, стр. 269-274. IEEE Computer Society, (1999)A reliable procedure in a new power management technique for a 200-Gbps packet forwarding LSI., , , , , , , и . IEICE Electron. Express, 10 (11): 20130231 (2013)Fanout-based fault diagnosis for open faults on pass/fail information., и . ATS, стр. 349-353. IEEE, (2006)A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model., , , и . PRDC, стр. 217-218. IEEE Computer Society, (2017)A simple technique for locating gate-level faults in combinational circuits., , и . Asian Test Symposium, стр. 65-70. IEEE Computer Society, (1995)Attempts Toward Behavior Recognition of the Asian Black Bears Using an Accelerometer., , , , и . ABC, том 291 из Smart Innovation, Systems and Technologies, стр. 57-79. Springer, (2021)Accelerating SDN/NFV with Transparent Offloading Architecture., , , , и . ONS, USENIX Association, (2014)