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Disambiguation of "Nigh, Phil"

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Layout-driven test generation.

, and . ICCAD, page 154-157. IEEE Computer Society, (1989)

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Michael Nightingale

Phil Zundel

Phil Langer

Phil Liebing

Phil Blunsom

 

Other publications of authors with the same name

SIA Roadmap: test must not limit future technologies.. ITC, page 1152. IEEE Computer Society, (1998)Physically-Aware N-Detect Test., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (2): 308-321 (2012)Industry leaders panel - How will testing change in the next 10 years?. ITC, page 1. IEEE Computer Society, (2011)How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?. ITC, page 1-4. IEEE Computer Society, (2012)Board manufacturing test correlation to IC manufacturing test., , , and . ITC, page 1-8. IEEE Computer Society, (2014)Binning for IC Quality: Experimental Studies on the SEMATECH Data., , , and . DFT, page 4-10. IEEE Computer Society, (1998)Application of non-parametric statistics of the parametric response for defect diagnosis., , , and . ITC, page 1-10. IEEE Computer Society, (2009)Adaptive testing - Cost reduction through test pattern sampling., , , , and . ITC, page 1-8. IEEE Computer Society, (2013)Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work... ITC, page 1420. IEEE Computer Society, (2004)Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions., and . ITC, page 309-318. IEEE Computer Society, (2004)