Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits.

H. Takahashi, M. Phadoongsidhi, Y. Higami, K. Saluja, and Y. Takamatsu. Asian Test Symposium, page 63-. IEEE Computer Society, (2001)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yoshinobu Kumazawa

Other publications of authors with the same name

Dynamic routing and wavelength assignment in multifiber WDM networks with sparse wavelength conversion.Dewiani, K. Hirata, Y. Higami, and S. ya Kobayashi. ICTC, page 567-572. IEEE, (2012)Post-BIST Fault Diagnosis for Multiple Faults.H. Takahashi, Y. Higami, S. Kadoyama, Y. Takamatsu, K. Yamazaki, T. Aikyo, and Y. Sato. IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation.T. Inamoto, T. Nishino, S. Wang, Y. Higami, and H. Takahashi. GCCE, page 561-565. IEEE, (2022)Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation.Y. Higami, K. Saluja, H. Takahashi, and Y. Takamatsu. VLSI Design, page 781-786. IEEE Computer Society, (2007)A Method to Find Don't Care Values in Test Sequences for Sequential Circuits.Y. Higami, S. ya Kobayashi, Y. Takamatsu, S. Kajihara, and I. Pomeranz. ICCD, page 397-. IEEE Computer Society, (2003)Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. ATS, page 97-102. IEEE Computer Society, (2008)New Class of Tests for Open Faults with Considering Adjacent Lines.H. Takahashi, Y. Higami, Y. Takamatsu, K. Yamazaki, T. Tsutsumi, H. Yotsuyanagi, and M. Hashizume. Asian Test Symposium, page 301-306. IEEE Computer Society, (2009)Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits.Y. Higami, Y. Takamatsu, K. Saluja, and K. Kinoshita. Asian Test Symposium, page 141-146. IEEE Computer Society, (1999)Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits.Y. Higami, K. Saluja, and K. Kinoshita. Asian Test Symposium, page 312-317. IEEE Computer Society, (1998)Enhancement of Clock Delay Faults Testing.Y. Higami, H. Takahashi, S. ya Kobayashi, and K. Saluja. ETS, page 216. IEEE Computer Society, (2011)

BibSonomy

Disambiguation of "Higami, Yoshinobu"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Higami, Yoshinobu"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits.