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Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , and . ISCAS, page 1-5. IEEE, (2019)Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics., , , , , and . ISCAS (5), page 4273-4276. IEEE, (2005)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , and . SMACD, page 1-4. IEEE, (2017)On line monitoring of RF power amplifiers with embedded temperature sensors., , and . IOLTS, page 109-113. IEEE Computer Society, (2012)Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation., , , , , , and . IRPS, page 1-7. IEEE, (2020)Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology., , , , , , , , , and 38 other author(s). DCIS, page 1-6. IEEE, (2023)A low-power RF front-end for 2.5 GHz receivers., , , , , , and . ISCAS, page 976-979. IEEE, (2008)Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling., , , and . ESSCIRC, page 105-108. IEEE, (2005)