( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories.

, , , , и . ATS, стр. 137-142. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Seiji Miyashiro

Seiji Osawa

 

Другие публикации лиц с тем же именем

A Statistical Quality Model for Delay Testing., , , , и . IEICE Trans. Electron., 89-C (3): 349-355 (2006)Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis., , , и . IEICE Trans. Inf. Syst., 78-D (7): 811-816 (1995)A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , и . VTS, стр. 197-202. IEEE Computer Society, (2012)Path delay test compaction with process variation tolerance., , , , , и . DAC, стр. 845-850. ACM, (2005)Aging test strategy and adaptive test scheduling for SoC failure prediction., , , , , и . IOLTS, стр. 21-26. IEEE Computer Society, (2010)On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test., , , , , , и . IOLTS, стр. 1-6. IEEE, (2020)Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA., , , и . PRDC, стр. 59-67. IEEE Computer Society, (2014)On compacting test sets by addition and removal of test vectors., , , и . VTS, стр. 202-207. IEEE Computer Society, (1994)A Method of Static Test Compaction Based on Don't Care Identification., , и . DELTA, стр. 392-395. IEEE Computer Society, (2002)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , и . VLSI Design, стр. 279-284. IEEE Computer Society, (2013)