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Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , и . ISCAS, стр. 1-5. IEEE, (2019)Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics., , , , , и . ISCAS (5), стр. 4273-4276. IEEE, (2005)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , и 2 other автор(ы). PATMOS, стр. 82-87. IEEE, (2018)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , и 7 other автор(ы). MWSCAS, стр. 1081-1084. IEEE, (2014)On line monitoring of RF power amplifiers with embedded temperature sensors., , и . IOLTS, стр. 109-113. IEEE Computer Society, (2012)Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation., , , , , , и . IRPS, стр. 1-7. IEEE, (2020)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , и . SMACD, стр. 1-4. IEEE, (2017)Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology., , , , , , , , , и 38 other автор(ы). DCIS, стр. 1-6. IEEE, (2023)Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling., , , и . ESSCIRC, стр. 105-108. IEEE, (2005)A low-power RF front-end for 2.5 GHz receivers., , , , , , и . ISCAS, стр. 976-979. IEEE, (2008)