( en | de | ru )

 

Disambiguation of "Hiramoto, Toshiro"

Author of the publication

copydeleteadd this publication to your clipboard
3-Layer stacked pixel-parallel CMOS image sensors using hybrid bonding of SOI wafers.

, , , , , , , , and . Imaging Sensors and Systems, page 1-4. Society for Imaging Science and Technology, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Toshiro Sugishita

 

Other publications of authors with the same name

Emerging nanoscale silicon devices taking advantage of nanostructure physics., , and . IBM J. Res. Dev., 50 (4-5): 411-418 (2006)Parallel nonvolatile programming of power-up states of SRAM cells., , , and . ASICON, page 418-421. IEEE, (2017)A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode with Normally-off Operation, High Mobility and Reliability for 3D Integrated Devices., , , , , , , , , and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)Recent Progress of Double/Dual-Gate Silicon IGBT Technologies., and . ASICON, page 1-4. IEEE, (2021)Ultra-low-voltage operation: device perspective.. ISLPED, page 59-60. IEEE/ACM, (2011)An Architectural Study for Inference Coprocessor Core at the Edge in IoT Sensing., , , , , , , , and . AICAS, page 305-309. IEEE, (2020)3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat)., , , , , , , , , and 12 other author(s). ASICON, page 1137-1140. IEEE, (2017)A 1.5-ns 256-kb BiCMOS SRAM with 60-ps 11-K logic gates., , , , , , , , , and 11 other author(s). IEEE J. Solid State Circuits, 29 (11): 1344-1352 (November 1994)Statistical Analysis of Current Onset Voltage (COV) Distribution of Scaled MOSFETs., , and . IEICE Trans. Electron., 96-C (5): 630-633 (2013)Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately., , , , , , , , , and 8 other author(s). ESSDERC, page 26-29. IEEE, (2018)