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Cube-Contained Random Patterns and Their Applications to the Complete Testing of Synthesized Multi-Level Circuits., and . ITC, page 473-482. IEEE Computer Society, (1991)Embedded Deterministic Test for Low-Cost Manufacturing., , , , , and . IEEE Des. Test Comput., 20 (5): 58-66 (2003)2D Test Sequence Generators., , and . IEEE Des. Test Comput., 20 (1): 51-59 (2003)Self-test methodology for at-speed test of crosstalk in chip interconnects., , and . DAC, page 619-624. ACM, (2000)Built-In Self-Test for Systems on Silicon., , and . VLSI Design, page 609-610. IEEE Computer Society, (1999)High Performance Dense Ring Generators., , , and . IEEE Trans. Computers, 55 (1): 83-87 (2006)Embedded deterministic test points for compact cell-aware tests., , , , , , , , , and . ITC, page 1-8. IEEE, (2015)On necessary and nonconflicting assignments in algorithmic test pattern generation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (4): 515-530 (1994)High Volume Diagnosis in Memory BIST Based on Compressed Failure Data., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (3): 441-453 (2010)Ring generators - new devices for embedded test applications., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (9): 1306-1320 (2004)