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Failure mechanisms and test methods for the SRAM TVC write-assist technique.

J. Kinseher, M. Völker, L. Zordan, and I. Polian. ETS, page 1-2. IEEE, (2016)

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Sabrina Zordan

Elena Bonetto

Giocondo Bonetti

Federico Bonetti

Marco Bonetta

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On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs.J. Kinseher, L. Zordan, and I. Polian. ATS, page 61-66. IEEE Computer Society, (2015)On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and N. Badereddine. ITC, page 1-10. IEEE Computer Society, (2013)Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.L. Zordan, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, and N. Badereddine. DDECS, page 353-358. IEEE Computer Society, (2011)A built-in scheme for testing and repairing voltage regulators of low-power srams.L. Zordan, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and N. Badereddine. VTS, page 1-6. IEEE Computer Society, (2013)On the Test and Mitigation of Malfunctions in Low-Power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, A. Virazel, and N. Badereddine. J. Electron. Test., 30 (5): 611-627 (2014)Test solution for data retention faults in low-power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and N. Badereddine. DATE, page 442-447. EDA Consortium San Jose, CA, USA / ACM DL, (2013)An effective BIST architecture for power-gating mechanisms in low-power SRAMs.A. Bosio, L. Dilillo, P. Girard, A. Virazel, and L. Zordan. ISQED, page 185-191. IEEE, (2016)Failure mechanisms and test methods for the SRAM TVC write-assist technique.J. Kinseher, M. Völker, L. Zordan, and I. Polian. ETS, page 1-2. IEEE, (2016)Low-power SRAMs power mode control logic: Failure analysis and test solutions.L. Zordan, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and N. Badereddine. ITC, page 1-10. IEEE Computer Society, (2012)Failure Analysis and Test Solutions for Low-Power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, and N. Badereddine. Asian Test Symposium, page 459-460. IEEE Computer Society, (2011)

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Disambiguation of "Zordan, Leonardo Bonet"

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Failure mechanisms and test methods for the SRAM TVC write-assist technique.

Please choose a person to relate this publication to

Sabrina Zordan

Elena Bonetto

Giocondo Bonetti

Federico Bonetti

Marco Bonetta

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Zordan, Leonardo Bonet"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Failure mechanisms and test methods for the SRAM TVC write-assist technique.

Please choose a person to relate this publication to

Sabrina Zordan

Elena Bonetto

Giocondo Bonetti

Federico Bonetti

Marco Bonetta

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Failure mechanisms and test methods for the SRAM TVC write-assist technique.