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FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.

H. Al-Awadhi, T. Aono, S. Wang, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. IEICE Trans. Inf. Syst., 103-D (11): 2289-2301 (2020)

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Yoshinobu Kumazawa

Other publications of authors with the same name

Post-BIST Fault Diagnosis for Multiple Faults.H. Takahashi, Y. Higami, S. Kadoyama, Y. Takamatsu, K. Yamazaki, T. Aikyo, and Y. Sato. IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)Dynamic routing and wavelength assignment in multifiber WDM networks with sparse wavelength conversion.Dewiani, K. Hirata, Y. Higami, and S. ya Kobayashi. ICTC, page 567-572. IEEE, (2012)A Method to Find Don't Care Values in Test Sequences for Sequential Circuits.Y. Higami, S. ya Kobayashi, Y. Takamatsu, S. Kajihara, and I. Pomeranz. ICCD, page 397-. IEEE Computer Society, (2003)Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation.Y. Higami, K. Saluja, H. Takahashi, and Y. Takamatsu. VLSI Design, page 781-786. IEEE Computer Society, (2007)Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation.T. Inamoto, T. Nishino, S. Wang, Y. Higami, and H. Takahashi. GCCE, page 561-565. IEEE, (2022)Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits.Y. Higami, Y. Takamatsu, K. Saluja, and K. Kinoshita. Asian Test Symposium, page 141-146. IEEE Computer Society, (1999)Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits.Y. Higami, K. Saluja, and K. Kinoshita. Asian Test Symposium, page 312-317. IEEE Computer Society, (1998)Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. ATS, page 97-102. IEEE Computer Society, (2008)New Class of Tests for Open Faults with Considering Adjacent Lines.H. Takahashi, Y. Higami, Y. Takamatsu, K. Yamazaki, T. Tsutsumi, H. Yotsuyanagi, and M. Hashizume. Asian Test Symposium, page 301-306. IEEE Computer Society, (2009)Enhancement of Clock Delay Faults Testing.Y. Higami, H. Takahashi, S. ya Kobayashi, and K. Saluja. ETS, page 216. IEEE Computer Society, (2011)

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Disambiguation of "Higami, Yoshinobu"

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FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

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Disambiguation

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Disambiguation of "Higami, Yoshinobu"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

Other publications of authors with the same name

Disambiguation

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URL
DOI
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Chicago
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FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.