From post

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.

, , , , и . ISSCC, стр. 308-310. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Networking industry trends in ESD protection for high speed IOs., , и . ASICON, стр. 1-4. IEEE, (2013)Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology., , , , , , и . IRPS, стр. 1-5. IEEE, (2019)Dynamic access control method for SDP-based network environments., , , , и . EURASIP J. Wirel. Commun. Netw., 2023 (1): 94 (декабря 2023)A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning., , , , и . ISSCC, стр. 308-310. IEEE, (2018)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller., , , , , , , , и . J. Electron. Test., 29 (4): 609-616 (2013)A parallel sort-balance mutual range-join algorithm on hypercube computers., , и . Microprocess. Microsystems, 22 (3-4): 209-215 (1998)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser., , , , , , , , и . J. Electron. Test., 30 (1): 149-154 (2014)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies., , , , , , и . IRPS, стр. 1-5. IEEE, (2019)Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams., , , , , , , и . IRPS, стр. 3. IEEE, (2015)Single-event effects on optical transceiver., , , , и . IRPS, стр. 6-1. IEEE, (2018)