Author of the publication

Design Considerations of Scaled Sub-0.1 ?m PD/SOI CMOS Circuits.

, , , and . ISQED, page 153-158. IEEE Computer Society, (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction., , , , , , , , , and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 534-543 (2015)Corrections to "Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction"., and . IEEE Trans. Very Large Scale Integr. Syst., 23 (7): 1380 (2015)Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50nm double gate devices., , , , , , and . Microelectron. J., 38 (8-9): 931-941 (2007)Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives., , and . ISLPED, page 337-342. ACM, (2010)"Cool low power" 1GHz multi-port register file and dynamic latch in 1.8 V, 0.25 mum SOI and bulk technology (poster session)., , , and . ISLPED, page 203-206. ACM, (2000)Mixed multi-threshold differential cascode voltage switch (MT-DCVS) circuit styles and strategies for low power VLSI design., , , , , and . ISLPED, page 263-266. ACM, (2001)14nm FinFET based supply voltage boosting techniques for extreme low Vmin operation., , , , and . VLSIC, page 268-. IEEE, (2015)Paving the Way for Pass Disturb Free Vertical NAND Storage via A Dedicated and String-Compatible Pass Gate., , , , , , , , , and 15 other author(s). CoRR, (2024)A Cryo-CMOS Transmon Qubit Controller and Verification with FPGA Emulation., , , , , , , , , and 14 other author(s). DATE, page 13-16. IEEE, (2022)Data Imbalance Handling Approaches for Accurate Statistical Modeling and Yield Analysis of Memory Designs., , and . ISCAS, page 1-5. IEEE, (2019)