From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

An efficient solution to the storage correspondence problem for large sequential circuits., , и . ASP-DAC, стр. 181-186. ACM, (2001)Levelized low cost delay test compaction considering IR-drop induced power supply noise., , , и . VTS, стр. 52-57. IEEE Computer Society, (2011)Techniques to Improve the Efficiency of SAT Based Path Delay Test Generation., , и . VLSID, стр. 50-55. IEEE Computer Society, (2014)CROWNE: Current Ratio Outliers with Neighbor Estimator., и . DFT, стр. 132-139. IEEE Computer Society, (2003)IDDQ Testing of Input/Output Resources of SRAM-Based FPGAs., , и . Asian Test Symposium, стр. 375-. IEEE Computer Society, (1999)Improved wafer-level spatial analysis for I_DDQ limit setting., и . ITC, стр. 82-91. IEEE Computer Society, (2001)A practical built-in current sensor for I_DDQ testing., , и . ITC, стр. 405-414. IEEE Computer Society, (2001)Fatal Fault Probability Prediction for Array Based Designs., , и . DFT, стр. 30-38. IEEE Computer Society, (1996)Test Generation for Global Delay Faults., и . ITC, стр. 433-442. IEEE Computer Society, (1996)Yiel Learning via Functional Test Data., и . ITC, стр. 626-635. IEEE Computer Society, (1995)