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A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.

, , , , , , , , , и . SMACD, стр. 1-4. IEEE, (2017)

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Joaquim Fortuny

Gonzalo Díaz Díaz

Leonardo Díaz

Carlos Diaz Cascajo

Roland Arturo Diaz-Bone

 

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Reliability challenges in Forksheet Devices: (Invited Paper)., , , , , , , , , и 2 other автор(ы). IRPS, стр. 1-8. IEEE, (2023)Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability., , , , , , , и . IRPS, стр. 1-9. IEEE, (2023)Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology., , , , , и . IRPS, стр. 1-6. IEEE, (2023)TARS: A toolbox for statistical reliability modeling of CMOS devices., , , , , , и . SMACD, стр. 1-4. IEEE, (2017)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , и . SMACD, стр. 1-4. IEEE, (2017)Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models., , , , , , , , , и 2 other автор(ы). SMACD, стр. 73-76. IEEE, (2018)Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation., , , , , и . IRPS, стр. 1-9. IEEE, (2023)A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies., , , , , , и . IRPS, стр. 3-1. IEEE, (2022)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , и . IRPS, стр. 1-5. IEEE, (2019)Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology., , , , , и . IRPS, стр. 4. IEEE, (2024)