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System Level Policies for Fault Tolerance Issues in the FERMI Project.

A. Dell'Acqua, M. Hansen, S. Inkinen, B. Lofstedt, J. Vanuxem, C. Svensson, J. Yuan, H. Hentzell, L. Buono, J. David, J. Genat, H. Lebbolo, O. LeDortz, P. Nayman, A. Savoy-Navarro, R. Zitoun, C. Alippi, L. Breveglieri, L. Dadda, V. Piuri, F. Salice, M. Sami, R. Stefanelli, P. Cattaneo, G. Fumagalli, G. Goggi, S. Brigati, U. Gatti, F. Maloberti, G. Torelli, P. Carlson, A. Kerek, G. Appelquist, S. Berglund, C. Bohm, M. Engström, N. Yamdagni, R. Sundblad, I. Höglund, and S. Persson. DFT, page 1-8. IEEE Computer Society, (1993)

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Stéphanie Gatti

Alessia Gatti

Umberto Gehling

Umberto Maio

Umberto Piarulli

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Recipes to build-up a rad-hard CMOS memory.C. Calligaro, and U. Gatti. IOLTS, page 216-219. IEEE, (2019)A current-mode CMOS integrated microsystem for current spinning magnetic hall sensors.H. Heidari, E. Bonizzoni, U. Gatti, and F. Maloberti. ISCAS, page 678-681. IEEE, (2014)Use of dynamic element matching in a multi-path sigma-delta modulator.V. Ferragina, A. Fornasari, U. Gatti, P. Malcovati, F. Maloberti, L. Marco, and A. Monfasani. ISCAS (1), page 649-652. IEEE, (2004)A SiGe BiCMOS burst-mode 155-Mb/s receiver for PON.S. Brigati, P. Colombara, L. D'Ascoli, U. Gatti, T. Kerekes, and P. Malcovati. IEEE J. Solid State Circuits, 37 (7): 887-894 (2002)A CMOS Current-Mode Magnetic Hall Sensor With Integrated Front-End.H. Heidari, E. Bonizzoni, U. Gatti, and F. Maloberti. IEEE Trans. Circuits Syst. I Regul. Pap., 62-I (5): 1270-1278 (2015)A multipath polyphase digital-to-analog converter for software radio transmission systems.D. Domanin, U. Gatti, P. Malcovati, and F. Maloberti. ISCAS, page 361-364. IEEE, (2000)Gain and offset mismatch calibration in multi-path sigma-delta modulators.V. Ferragina, A. Fornasari, U. Gatti, P. Malcovati, and F. Maloberti. ISCAS (1), page 953-956. IEEE, (2003)Radiation-hardened techniques for CMOS flash ADC.U. Gatti, C. Calligaro, E. Pikhay, and Y. Roizin. ICECS, page 1-4. IEEE, (2014)Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors.M. Andjelkovic, M. Marjanovic, B. Drasko, C. Calligaro, O. Schrape, U. Gatti, F. Kuentzer, S. Ilic, G. Ristic, and M. Krstic. J. Circuits Syst. Comput., 31 (18): 2240007:1-2240007:24 (December 2022)An accurate CMOS sample-and-hold circuit.U. Gatti, F. Maloberti, and G. Palmisano. IEEE J. Solid State Circuits, 27 (1): 120-122 (January 1992)

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Disambiguation of "Gatti, Umberto"

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System Level Policies for Fault Tolerance Issues in the FERMI Project.

Please choose a person to relate this publication to

Stéphanie Gatti

Alessia Gatti

Umberto Gehling

Umberto Maio

Umberto Piarulli

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Gatti, Umberto"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML System Level Policies for Fault Tolerance Issues in the FERMI Project.

Please choose a person to relate this publication to

Stéphanie Gatti

Alessia Gatti

Umberto Gehling

Umberto Maio

Umberto Piarulli

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

System Level Policies for Fault Tolerance Issues in the FERMI Project.