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Disambiguation of "Kinoshita, Kozo"

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A BIST Circuit for IDDQ Tests.

, , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)

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Kozo Yabuta

Asako Kinoshita

Kozo Kosugi

Asako Kinoshita

Yvette Kozova-Razanantoanina

 

Other publications of authors with the same name

Removal of Redundancy in Logic Circuits under Classification of Undetectable Faults., , and . FTCS, page 263-270. IEEE Computer Society, (1992)A Novel ATPG Method for Capture Power Reduction during Scan Testing., , , , , , and . IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)Design of High-Level Test Language for Digital LSI., , and . ITC, page 508-513. IEEE Computer Society, (1983)Cascade Realization of 3-Input 3-Output Conservative Logic Circuits., and . IEEE Trans. Computers, 27 (3): 214-221 (1978)A BIST Circuit for IDDQ Tests., , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)Memory reduction of IDDQ test compaction for internal and external bridging faults., and . Asian Test Symposium, page 350-355. IEEE Computer Society, (2000)A high-speed IDDQ sensor implementation., , , and . Asian Test Symposium, page 356-361. IEEE Computer Society, (2000)Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique., , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (1996)Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits., , and . Asian Test Symposium, page 121-126. IEEE Computer Society, (1999)IDDQ Current Dependency on Test Vectors and Bridging Resistance., , and . Asian Test Symposium, page 158-163. IEEE Computer Society, (1999)