Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

K. Miyase, Y. Yamato, K. Noda, H. Ito, K. Hatayama, T. Aikyo, X. Wen, and S. Kajihara. ICCAD, page 97-104. ACM, (2009)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Seiji Miyashiro

Seiji Osawa

Other publications of authors with the same name

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.K. Miyase, M. Aso, R. Ootsuka, X. Wen, H. Furukawa, Y. Yamato, K. Enokimoto, and S. Kajihara. VTS, page 197-202. IEEE Computer Society, (2012)Path delay test compaction with process variation tolerance.S. Kajihara, M. Fukunaga, X. Wen, T. Maeda, S. Hamada, and Y. Sato. DAC, page 845-850. ACM, (2005)A Statistical Quality Model for Delay Testing.Y. Sato, S. Hamada, T. Maeda, A. Takatori, and S. Kajihara. IEICE Trans. Electron., 89-C (3): 349-355 (2006)Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis.S. Kajihara, R. Nishigaya, T. Sumioka, and K. Kinoshita. IEICE Trans. Inf. Syst., 78-D (7): 811-816 (1995)On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.S. Reddy, I. Pomeranz, H. Tang, S. Kajihara, and K. Kinoshita. ITC, page 83-89. IEEE Computer Society, (2002)On validating data hold times for flip-flops in sequential circuits.S. Reddy, I. Pomeranz, S. Kajihara, A. Murakami, S. Takeoka, and M. Ohta. ITC, page 317-325. IEEE Computer Society, (2000)DART: Dependable VLSI test architecture and its implementation.Y. Sato, S. Kajihara, T. Yoneda, K. Hatayama, M. Inoue, Y. Miura, S. Untake, T. Hasegawa, M. Sato, and K. Shimamura. ITC, page 1-10. IEEE Computer Society, (2012)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression.K. Enokimoto, X. Wen, K. Miyase, J. Huang, S. Kajihara, and L. Wang. VLSI Design, page 279-284. IEEE Computer Society, (2013)On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits.H. Ichihara, K. Kinoshita, and S. Kajihara. Asian Test Symposium, page 147-152. IEEE Computer Society, (1999)An Efficient Procedure for Obtaining Implication Relations and Its Application to Redundancy Identification.H. Ichihara, S. Kajihara, and K. Kinoshita. Asian Test Symposium, page 58-63. IEEE Computer Society, (1998)

BibSonomy

Disambiguation of "Kajihara, Seiji"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

Please choose a person to relate this publication to

Seiji Miyashiro

Seiji Osawa

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Kajihara, Seiji"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

Please choose a person to relate this publication to

Seiji Miyashiro

Seiji Osawa

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.