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Disambiguation of "Miyase, Kohei"

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A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

, , , , , , , and . ICCAD, page 97-104. ACM, (2009)

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Kohei Tatsumi

Kohei Tatsumi

Mohamed Koheil

Susanne Koheil

 

Other publications of authors with the same name

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , and . VTS, page 197-202. IEEE Computer Society, (2012)LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing., , , , , and . IEEE Des. Test, 30 (4): 60-70 (2013)Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory., , and . IOLTS, page 226-227. IEEE, (2018)Don't Care Identification and Statistical Encoding for Test Data Compression., , , , and . IEICE Trans. Inf. Syst., 87-D (3): 544-550 (2004)On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption., , , , , and . IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , and . VLSI Design, page 279-284. IEEE Computer Society, (2013)On Improving Defect Coverage of Stuck-at Fault Tests., , , , and . Asian Test Symposium, page 216-223. IEEE Computer Society, (2005)A Method of Static Test Compaction Based on Don't Care Identification., , and . DELTA, page 392-395. IEEE Computer Society, (2002)Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing., , , , , , and . J. Electron. Test., 24 (4): 379-391 (2008)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits., , , , and . IEICE Trans. Inf. Syst., 91-D (3): 667-674 (2008)