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Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test., , and . PRDC, page 124-129. IEEE, (2019)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling., , and . MCSoC, page 501-507. IEEE, (2023)Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing., , , , , , and . ATS, page 149-154. IEEE, (2018)BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell., , , , and . ETS, page 1-6. IEEE, (2023)Logic Fault Diagnosis of Hidden Delay Defects., , , , , , and . ITC, page 1-10. IEEE, (2020)STAHL: A Novel Scan-Test-Aware Hardened Latch Design., , , , and . ETS, page 1-6. IEEE, (2019)A Fault-Tolerant MPSoC For CubeSats., , , , , , , , , and . DFT, page 1-6. IEEE, (2019)Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses., , , , and . ITC, page 1-10. IEEE, (2019)Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm., , , , and . DSN-W, page 195-198. IEEE, (2023)On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks., , and . ETS, page 1-6. IEEE, (2022)