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Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization., , , , and . DCIS, page 1-4. IEEE, (2018)Reliability simulation for analog ICs: Goals, solutions, and challenges., , , , , , , and . Integr., (2016)Effect of oxide breakdown on RS latches., , , and . Microelectron. Reliab., 47 (4-5): 581-584 (2007)Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Threshold voltage and on-current Variability related to interface traps spatial distribution., , , , , , , , and . ESSDERC, page 230-233. IEEE, (2015)Reliability of ultra-thin oxides in CMOS circuits., , , and . Microelectron. Reliab., 43 (9-11): 1353-1360 (2003)Shape-shifting digital hardware concept: Towards a new adaptive computing system., , , , , and . AHS, page 167-173. IEEE, (2012)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)Device variability tolerance of a RRAM-based self-organizing neuromorphic system., , , , , , and . IRPS, page 4-1. IEEE, (2018)Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , and . ISCAS, page 1-5. IEEE, (2019)