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A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , и . IEEE Access, (2023)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , и . DDECS, стр. 1-6. IEEE, (2019)An innovative Strategy to Quickly Grade Functional Test Programs., , , , , , , , , и . ITC, стр. 355-364. IEEE, (2022)Innovative methods for Burn-In related Stress Metrics Computation., , , , , , , , и . DTIS, стр. 1-6. IEEE, (2021)An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip., , , , , , и . ETS, стр. 1-6. IEEE, (2022)Test, Reliability and Functional Safety Trends for Automotive System-on-Chip., , , , , , , , , и 14 other автор(ы). ETS, стр. 1-10. IEEE, (2022)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , и . DDECS, стр. 69-74. IEEE, (2021)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , и . DFT, стр. 1-6. IEEE, (2022)A novel SEU injection setup for Automotive SoC., , , , , , , и . ISIE, стр. 623-626. IEEE, (2022)