( en | de | ru )

 

Disambiguation of "Grill, Alexander"

Author of the publication

copydeleteadd this publication to your clipboard
A Compact Physics Analytical Model for Hot-Carrier Degradation.

, , , , , , , , and . IRPS, page 1-7. IEEE, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Rudolf Grill

Eva Grill

Irene Grill

Franz Grill

Walter Grill

 

Other publications of authors with the same name

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures., , , , , , , , , and . IRPS, page 1-6. IEEE, (2020)Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2019)On the impact of mechanical stress on gate oxide trapping., , , , , , , , and . IRPS, page 1-5. IEEE, (2020)On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors., , , , , , , , and . IRPS, page 11. IEEE, (2022)Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors., , , , , , , , , and 2 other author(s). IRPS, page 10. IEEE, (2022)Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress., , , , , , , , , and 1 other author(s). IRPS, page 10. IEEE, (2022)Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements., , , , , , , , , and 7 other author(s). VLSI Technology and Circuits, page 230-231. IEEE, (2022)Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications., , , , , , and . IRPS, page 1-7. IEEE, (2024)Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics., , , , , , , , and . IRPS, page 4. IEEE, (2022)A Compact Physics Analytical Model for Hot-Carrier Degradation., , , , , , , , and . IRPS, page 1-7. IEEE, (2020)