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Disambiguation of "Tsai, Kun-Han"

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Improved weight assignment for logic switching activity during at-speed test pattern generation.

, , , , , and . ASP-DAC, page 493-498. IEEE, (2010)

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Kun-Han Lin

Ming-Han Tsai

Wei-Ding Tsai

Wei-Ding Tsai

Schi-chien Tsai

 

Other publications of authors with the same name

Online slack-time binning for IO-registered die-to-die interconnects., , , , , and . ITC, page 1-8. IEEE, (2016)Small delay testing for TSVs in 3-D ICs., , , , , , and . DAC, page 1031-1036. ACM, (2012)Scan based speed-path debug for a microprocessor., , , , , , and . European Test Symposium, page 207-212. IEEE Computer Society, (2010)A Low Complexity Transmitter Architecture and Its Application to PAPR Reduction in SFBC MIMO-OFDM Systems., , and . ICC, page 1-5. IEEE, (2010)Circuit and Methodology for Testing Small Delay Faults in the Clock Network., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2087-2097 (2018)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , and . ITC, page 1031-1040. IEEE Computer Society, (2003)Built-in constraint resolution., , , and . ITC, page 10. IEEE Computer Society, (2005)Embedded Deterministic Test for Low-Cost Manufacturing Test., , , , , , , , , and 1 other author(s). ITC, page 301-310. IEEE Computer Society, (2002)X-Sources Analysis for Improving the Test Quality.. ITC-Asia, page 121-126. IEEE, (2018)Test Coverage Analysis for Designs with Timing Exceptions., and . ATS, page 169-174. IEEE Computer Society, (2017)