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RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device.

, , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 31 (10): 1578-1591 (October 2023)

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Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM., , , , , and . DATE, page 1717-1722. IEEE, (2021)Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis., , , , , , , , and . VTS, page 1-10. IEEE, (2020)A novel mathematical model for predicting landslide displacement., , and . Soft Comput., 25 (3): 2453-2466 (2021)Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions., , , , , and . ITC, page 143-152. IEEE, (2021)Special Session: STT-MRAMs: Technology, Design and Test., , , , , and . VTS, page 1-10. IEEE, (2022)A Hybrid Kernel Pruning Approach for Efficient and Accurate CNNs., , , , , , , and . ICA3PP (7), volume 14493 of Lecture Notes in Computer Science, page 34-46. Springer, (2023)Device-Aware Test: A New Test Approach Towards DPPB Level., , , , , , , and . ITC, page 1-10. IEEE, (2019)Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing., , , , , , , , and . ETS, page 1-6. IEEE, (2019)A new grey prediction model and its application to predicting landslide displacement., , , and . Appl. Soft Comput., (2020)A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , and . DATE, page 792-797. IEEE, (2020)