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Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.

, , , , , , , , and . ICCAD, page 52-58. IEEE Computer Society, (2008)

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Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment., , , , , , , and . ICCAD, page 97-104. ACM, (2009)A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , and . VTS, page 197-202. IEEE Computer Society, (2012)An ECC-based memory architecture with online self-repair capabilities for reliability enhancement., , , , and . ETS, page 1-6. IEEE, (2015)A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation., , , and . ITC, page 1-8. IEEE Computer Society, (2012)High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme., , , , , , , and . IEICE Trans. Inf. Syst., 93-D (1): 2-9 (2010)A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing., , , , and . IEICE Trans. Inf. Syst., 94-D (4): 833-840 (2011)CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing., , , , , , , and . Asian Test Symposium, page 99-104. IEEE Computer Society, (2009)Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling., , , , , , , , , and 1 other author(s). Asian Test Symposium, page 90-95. IEEE Computer Society, (2011)Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification., , , , , , , , and . ICCAD, page 52-58. IEEE Computer Society, (2008)