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A 135.6Tbps/W 2R2W SRAM with 12T Logic Bit-cell with Vmin Down to 335mV Targeted for Machine-Learning Applications in 6nm FinFET CMOS Technology.

, , , , and . VLSI Technology and Circuits, page 110-111. IEEE, (2022)

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A 32nm High-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation., , , , , , , and . ISSCC, page 346-347. IEEE, (2010)15.3 A 351TOPS/W and 372.4GOPS Compute-in-Memory SRAM Macro in 7nm FinFET CMOS for Machine-Learning Applications., , , , , , , and . ISSCC, page 242-244. IEEE, (2020)A 153Mb-SRAM Design with Dynamic Stability Enhancement and Leakage Reduction in 45nm High-Κ Metal-Gate CMOS Technology., , , , , , , , , and . ISSCC, page 376-377. IEEE, (2008)Efficient Processing of MLPerf Mobile Workloads Using Digital Compute-In-Memory Macros., , , , , , , , , and 1 other author(s). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (4): 1191-1205 (April 2024)A 5-nm 254-TOPS/W 221-TOPS/mm2 Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations., , , , , , , , , and 8 other author(s). ISSCC, page 1-3. IEEE, (2022)15.7 A 32Mb RRAM in a 12nm FinFet Technology with a 0.0249μm2 Bit-Cell, a 3.2GB/S Read Throughput, a 10KCycle Write Endurance and a 10-Year Retention at 105°C., , , , , , , , , and 7 other author(s). ISSCC, page 288-290. IEEE, (2024)A 3.8 GHz 153 Mb SRAM Design With Dynamic Stability Enhancement and Leakage Reduction in 45 nm High-k Metal Gate CMOS Technology., , , , , , , , , and . IEEE J. Solid State Circuits, 44 (1): 148-154 (2009)2nd generation embedded DRAM with 4X lower self refresh power in 22nm Tri-Gate CMOS technology., , , , , , , , , and 2 other author(s). VLSIC, page 1-2. IEEE, (2014)13.1 A 1Gb 2GHz embedded DRAM in 22nm tri-gate CMOS technology., , , , , , , , , and 2 other author(s). ISSCC, page 230-231. IEEE, (2014)An 89TOPS/W and 16.3TOPS/mm2 All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications., , , , , , , , , and 10 other author(s). ISSCC, page 252-254. IEEE, (2021)