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Achieving higher yield through diagnosis-the ASIC perspective.

. ITC, стр. 2. IEEE Computer Society, (2005)

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Chris Thümmler

Chris Paschold

Chris Neisse

Chris Protzel

Chris Fröhlich

 

Другие публикации лиц с тем же именем

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost., , , , , и . ITC, стр. 203-212. IEEE Computer Society, (2004)Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ., , , , , и . ITC, стр. 565-573. IEEE Computer Society, (2003)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , и . ITC, стр. 1031-1040. IEEE Computer Society, (2003)A Hybrid Flow for Memory Failure Bitmap Classification., , , , , , и . Asian Test Symposium, стр. 314-319. IEEE Computer Society, (2012)Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis., , , и . ITC, стр. 9. IEEE Computer Society, (2005)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , и . IEEE Des. Test Comput., 23 (5): 390-400 (2006)Minimum Testing Requirements to Screen Temperature Dependent Defects., , и . ITC, стр. 300-308. IEEE Computer Society, (2004)Achieving higher yield through diagnosis-the ASIC perspective.. ITC, стр. 2. IEEE Computer Society, (2005)Screening MinVDD Outliers Using Feed-Forward Voltage Testing., , , , , , , и . ITC, стр. 673-682. IEEE Computer Society, (2002)