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Within-Die Variation-Aware Dynamic-Voltage-Frequency-Scaling With Optimal Core Allocation and Thread Hopping for the 80-Core TeraFLOPS Processor.

, , , , , , , , , , , and . IEEE J. Solid State Circuits, 46 (1): 184-193 (2011)

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Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops., , , , , , , , , and 1 other author(s). IEEE J. Emerg. Sel. Topics Circuits Syst., 1 (3): 208-217 (2011)4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate CMOS featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging., , , , , , and . ISSCC, page 1-3. IEEE, (2015)An energy harvesting wireless sensor node for IoT systems featuring a near-threshold voltage IA-32 microcontroller in 14nm tri-gate CMOS., , , , , , , , , and 2 other author(s). VLSI Circuits, page 1-2. IEEE, (2016)An IA-32 processor with a wide voltage operating range in 32nm CMOS., , , , , , , , , and 9 other author(s). Hot Chips Symposium, page 1-37. IEEE, (2012)2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic Process., , , , , , , , , and 1 other author(s). ISSCC, page 274-275. IEEE, (2008)Within-die variation-aware dynamic-voltage-frequency scaling core mapping and thread hopping for an 80-core processor., , , , , , , , , and 2 other author(s). ISSCC, page 174-175. IEEE, (2010)A 280mV-to-1.2V wide-operating-range IA-32 processor in 32nm CMOS., , , , , , , , , and 11 other author(s). ISSCC, page 66-68. IEEE, (2012)A Sub-cm3 Energy-Harvesting Stacked Wireless Sensor Node Featuring a Near-Threshold Voltage IA-32 Microcontroller in 14-nm Tri-Gate CMOS for Always-ON Always-Sensing Applications., , , , , , , , , and 2 other author(s). IEEE J. Solid State Circuits, 52 (4): 961-971 (2017)All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control., , , , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 58-I (9): 2017-2025 (2011)A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 46 (1): 194-208 (2011)