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Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

, , , , , , , , , и . ATS, стр. 139-146. IEEE, (2006)

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Shuji Kimura

Shuji Sato

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Not all Delay Tests Are the Same - SDQL Model Shows True-Time., , , , , и . ATS, стр. 147-152. IEEE, (2006)Path delay test compaction with process variation tolerance., , , , , и . DAC, стр. 845-850. ACM, (2005)A Statistical Quality Model for Delay Testing., , , , и . IEICE Trans. Electron., 89-C (3): 349-355 (2006)Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects., , , , , , , , , и . ATS, стр. 139-146. IEEE, (2006)Invisible delay quality - SDQM model lights up what could not be seen., , , , , и . ITC, стр. 9. IEEE Computer Society, (2005)Recognition of Sensitized Longest Paths in Transition Delay Test., , , , и . ITC, стр. 1-6. IEEE Computer Society, (2006)A Framework of High-quality Transition Fault ATPG for Scan Circuits., , , , , , и . ITC, стр. 1-6. IEEE Computer Society, (2006)Evaluation of the statistical delay quality model., , , , и . ASP-DAC, стр. 305-310. ACM Press, (2005)A dynamic test compaction procedure for high-quality path delay testing., , , , , и . ASP-DAC, стр. 348-353. IEEE, (2006)