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Disambiguation of "Croes, Kristof"

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Towards accurate temperature prediction in BEOL for reliability assessment (Invited).

, , , , , , , , , , and . IRPS, page 1-7. IEEE, (2023)

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Serge Alex Cyriel Maurice Croes

Kristof Seidl

Ariane Kristof

Kristof Dascher

Kristof Chwalisz

 

Other publications of authors with the same name

Towards accurate temperature prediction in BEOL for reliability assessment (Invited)., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2023)System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents., , , , and . IRPS, page 1-7. IEEE, (2022)Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism., , , , , , , and . IRPS, page 4. IEEE, (2022)Silicon Photonics for 56G NRZ Optical Interconnects., , , , , , , , , and 7 other author(s). OFC, page 1-3. IEEE, (2018)Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors., , , , , , , and . OFC, page 1-3. IEEE, (2022)Design considerations for the mechanical integrity of airgaps in nano-interconnects under chip-package interaction; a numerical investigation., , , , , and . Microelectron. Reliab., (2016)Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects., , , , , , , and . IRPS, page 1-6. IEEE, (2019)Impact of via density and passivation thickness on the mechanical integrity of advanced Back-End-Of-Line interconnects., , , , , , , , , and 1 other author(s). Microelectron. Reliab., (2017)Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM., , , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5327-5332 (2022)A pragmatic network-aware paradigm for system-level electromigration predictions at scale., , , and . IRPS, page 1-6. IEEE, (2023)