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Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.

T. Marukame, K. Ueyoshi, T. Asai, M. Motomura, A. Schmid, M. Suzuki, Y. Higashi, and Y. Mitani. IEEE Trans. Circuits Syst. II Express Briefs, 64-II (4): 462-466 (2017)

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Susan Higashi

Yusuke Sugihara

Yusuke Ohta

Yusuke Asai

Other publications of authors with the same name

Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.H. Seki, R. Ichihara, Y. Higashi, Y. Nakasaki, M. Saitoh, and M. Suzuki. IRPS, page 1-7. IEEE, (2023)New Insights into the Imprint Effect in FE-HfO2 and its Recovery.Y. Higashi, K. Florent, A. Subirats, B. Kaczer, L. Piazza, S. Clima, N. Ronchi, S. McMitchell, K. Banerjee, U. Celano and 3 other author(s). IRPS, page 1-7. IEEE, (2019)Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance.Y. Higashi, J. Bastos, A. Chasin, L. Breuil, A. Arreghini, S. Ramesh, S. Rachidi, Y. Jeong, G. den Bosch, and M. Rosmeulen. IRPS, page 1-6. IEEE, (2024)Side and Corner Region Non-Uniformities in Grown SiO2 and Their Implications on Current, Capacitance and Breakdown Characteristics.J. Bastos, B. O'Sullivan, Y. Higashi, A. Chasin, J. Franco, H. Arimura, J. Ganguly, E. Capogreco, A. Spessot, and N. Horiguchi. IRPS, page 36. IEEE, (2024)Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability.Y. Aiba, Y. Higashi, H. Tanaka, H. Tanaka, F. Kikushima, T. Fujisawa, H. Mukaida, M. Miura, and T. Sanuki. VLSI Technology and Circuits, page 1-2. IEEE, (2023)Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements.M. Alam, Y. Higashi, B. Truijen, B. Kaczer, M. Popovici, B. O'Sullivan, P. Roussel, R. Degraeve, M. Heyns, and J. Houdt. VLSI Technology and Circuits, page 340-342. IEEE, (2022)Future route presentation to autonomous mobile wheelchair passengers using the movement of vibrotactile stimuli.Y. Higashi, T. Ikeda, H. Takai, and S. Iwaki. SICE, page 749-754. IEEE, (2022)Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.T. Marukame, K. Ueyoshi, T. Asai, M. Motomura, A. Schmid, M. Suzuki, Y. Higashi, and Y. Mitani. IEEE Trans. Circuits Syst. II Express Briefs, 64-II (4): 462-466 (2017)Study on mechanism of thermal curing in ultra-thin gate dielectrics.Y. Mitani, Y. Higashi, and Y. Nakasaki. IRPS, page 3. IEEE, (2018)Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics.T. Hamai, K. Suzuki, R. Ichihara, Y. Higashi, Y. Yoshimura, K. Sakuma, K. Ota, K. Takahashi, K. Matsuo, S. Fujii and 1 other author(s). IRPS, page 1-5. IEEE, (2023)

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Disambiguation of "Higashi, Yusuke"

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Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.

Please choose a person to relate this publication to

Susan Higashi

Yusuke Sugihara

Yusuke Ohta

Yusuke Asai

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Higashi, Yusuke"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.

Please choose a person to relate this publication to

Susan Higashi

Yusuke Sugihara

Yusuke Ohta

Yusuke Asai

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
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Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.