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Disambiguation of "Rodríguez-Montañés, Rosa"

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Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs.

, and . DATE, page 490-494. IEEE Computer Society, (1998)

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Daniel Rodríguez

Agustín Rodríguez

Carlos Rodríguez

Jerónimo Rodríguez

Karen Rodríguez

 

Other publications of authors with the same name

Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability., and . EDAC-ETC-EUROASIC, page 356-360. IEEE Computer Society, (1994)Gate Leakage Impact on Full Open Defects in Interconnect Lines., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2209-2220 (2011)Bridging Defects Resistance Measurements in a CMOS Process., , and . ITC, page 892-899. IEEE Computer Society, (1992)Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs., and . DATE, page 490-494. IEEE Computer Society, (1998)Post-bond test of Through-Silicon Vias with open defects., , and . ETS, page 1-6. IEEE, (2014)Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents., , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (5): 1739-1748 (2016)Quiescent current analysis and experimentation of defective CMOS circuits., , , , and . J. Electron. Test., 3 (4): 337-348 (1992)Power-aware voltage tuning for STT-MRAM reliability., , , , , , and . ETS, page 1-6. IEEE, (2015)Diagnosis of full open defects in interconnect lines with fan-out., , , , , and . European Test Symposium, page 233-238. IEEE Computer Society, (2010)Delay caused by resistive opens in interconnecting lines., , and . Integr., 42 (3): 286-293 (2009)