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Disambiguation of "Kato, Takaaki"

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A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST.

, , , , and . ATS, page 203-208. IEEE Computer Society, (2016)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ferenc Kató

Takaaki Ishizawa

Takaaki Yamasaki

Keiichi Kato

Yumiko Kato

 

Other publications of authors with the same name

Study on self-sensing electrostatic suspension using a variable capacitor., , , and . AMC, page 426-429. IEEE, (2010)On Design and Performance Analysis of a Superscalar Architecture., , and . ICPP (1), page 171-178. CRC Press, (1992)On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST., , , , and . ATS, page 30-35. IEEE, (2018)On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test., , , , , , and . IOLTS, page 1-6. IEEE, (2020)Specification and Verification Techniques of Embedded Systems Using Probabilistic Linear Hybrid Automata., , and . ICESS, volume 3820 of Lecture Notes in Computer Science, page 346-360. Springer, (2005)Path Delay Measurement with Correction for Temperature And Voltage Variations., , and . ITC-Asia, page 112-117. IEEE, (2020)Analysis of Japanese Folktales for the Purpose of Story Generation., , , and . ICEC, volume 5309 of Lecture Notes in Computer Science, page 67-76. Springer, (2008)On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor., , , and . ATS, page 1-6. IEEE, (2020)A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST., , , , and . ATS, page 203-208. IEEE Computer Society, (2016)Innovative Test Practices in Asia., , , , , , , , , and 3 other author(s). VTS, page 1. IEEE, (2020)