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Disambiguation of "Ghibaudo, Gérard"

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RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs.

, , , , , , , , and . NATW, page 28-33. IEEE, (2016)

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Gérard Gäfgen

Walter Gérard

Gérard Sprüssel

Bruno Gérard

Emilie Gérard

 

Other publications of authors with the same name

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs., , , , , and . ICECS, page 953-956. IEEE, (2012)Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions., , , , , and . Microelectron. Reliab., 41 (9-10): 1295-1300 (2001)Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator., , , , , , , and . ESSDERC, page 166-169. IEEE, (2018)Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs., , , , , and . ESSDERC, page 142-145. IEEE, (2016)Effective work function engineering by sacrificial lanthanum diffusion on HfON-based 14 nm NFET devices., , , , , , , , , and 2 other author(s). ESSDERC, page 246-249. IEEE, (2015)Optimization of Trigate-On-Insulator MOSFET aspect ratio with MASTAR., , , , and . ESSDERC, page 242-245. IEEE, (2015)Guest Editorial., and . Microelectron. Reliab., 43 (8): 1173 (2003)Multiple-pulse dynamic stability and failure analysis of low-voltage 6T-SRAM bitcells in 28nm UTBB-FDSOI., , , , , , , and . ISCAS, page 1452-1455. IEEE, (2013)Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2021)Electrical noise and RTS fluctuations in advanced CMOS devices., and . Microelectron. Reliab., 42 (4-5): 573-582 (2002)